Note: These assignments will not be graded for credit but are meant for you to learn the material discussed in the class by solving simple related problems.

Do the following problems for the c17 circuit:

1. Obtain a test pattern for the single stuck fault (SSF), line g stuck-at 1 (SA1), trying to minimize the number of primary inputs assigned to binary values.

2. In the class we discussed the SSF, line g SA0. Can you think of the way in which the test patterns for the two faults are related? In general, what is the relationship, if any, between the test patterns that detect the two SSFs on the same line.

3. Obtain a test pattern that would detect the 0-dominant bridging fault between the lines e and f in the circuit Repeat the same for the 1-dominant fault on the same lines.

4. Obtain as small a set of test patterns as you can to detect a Byzantine fault caused by an open fault on line g.