Improving the Testing and Testability of Software Product Lines
I. Cabral, M. B. Cohen, G. Rothermel
Proceedings of the International Software Product Line Conference
September, 2010, pages 241-255
Software Product Line (SPL) engineering offers several advantages
in the development of families of software products. There is
still a need, however, for better understanding of testability issues and
for testing techniques that can operate cost-effectively on SPLs. In this
paper we consider these testability issues and highlight some differences
between optional versus alternative features. We then provide a graph
based testing approach called the FIG Basis Path method that selects
products and features for testing based on a feature dependency graph.
We conduct a case study on several non-trivial SPLs and show that for
these subjects, the FIG Basis Path method is as effective as testing all
products, but tests no more than 24% of the products in the SPL.